A pilot study of half-value layer measurements using a semiconductor dosimeter for intraoral radiography.

Nouchi, Shun; Yoshida, Hidenori; Miki, Yusaku; Tezuka, Yasuhito; Ogawa, Ruri; Ogura, Ichiro

Nouchi, Shun; Yoshida, Hidenori; Miki, Yusaku; Tezuka, Yasuhito; Ogawa, Ruri; Ogura, Ichiro.

Afiliação

Nouchi S; Department of Radiology, The Nippon Dental University Niigata Hospital, Niigata, Japan.
Yoshida H; Department of Radiological Technology, Niigata University of Health and Welfare, Niigata, Japan.
Miki Y; Department of Radiology, The Nippon Dental University Niigata Hospital, Niigata, Japan.
Tezuka Y; Department of Oral and Maxillofacial Radiology, The Nippon Dental University School of Life Dentistry at Niigata, Niigata, Japan.
Ogawa R; Department of Oral and Maxillofacial Radiology, The Nippon Dental University School of Life Dentistry at Niigata, Niigata, Japan.
Ogura I; Department of Radiology, The Nippon Dental University Niigata Hospital, Niigata, Japan.

Imaging Sci Dent ; 53(3): 217-220, 2023 Sep.

Article em En | MEDLINE | ID: mdl-37799740

Palavras-chave

Quality Assurance, Health Care; Radiation Dosimeters; Radiation Exposure; Radiography, Dental

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Imaging Sci Dent Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Japão

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