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1.
MethodsX ; 13: 102873, 2024 Dec.
Article in English | MEDLINE | ID: mdl-39161784

ABSTRACT

This article presents a direct method for temperature control in solid-state lasers, where temperature stability is crucial for optimizing the performance and reliability of such lasers. The proposed method utilizes Peltier chips for both cooling and heating the laser crystal to achieve precise temperature regulation. The system design is based on the step response of the open-loop thermal system and employs a proportional-integral (PI) controller for closed-loop temperature control. Comprehensive testing on a femtosecond Titanium-Sapphire Laser (Ti:Sapphire laser) demonstrated that the system is capable of maintaining the desired operating temperature with remarkable stability and efficiency, highlighting its practicality for real-world applications. Method Outline:•Utilization of Peltier chips for precise temperature control.•Estimation of first-order transfer function based on step response.•Implementation of a proportional-integral (PI) controller for closed-loop temperature regulation.

2.
Opt Express ; 21(6): 6851-66, 2013 Mar 25.
Article in English | MEDLINE | ID: mdl-23546067

ABSTRACT

Misalignments always occur in real optical systems. These misalignments do not generate new aberration forms, but they change the aberration field dependence. Two-mirror telescopes have been used in several applications. We analyze a two-mirror telescope configuration that has negligible sensitivity to decenter misalignments. By applying the wave aberration theory for plane-symmetric optical systems it is shown that the asphericity in the secondary mirror, if properly chosen, can compensate for any decenter perturbation allowing third-order coma unchanged across the field of view. For any two-mirror system it is possible to find a configuration in which decenter misalignments do not generate field-uniform coma.


Subject(s)
Artifacts , Image Enhancement/instrumentation , Lenses , Telescopes , Computer-Aided Design , Equipment Design , Equipment Failure Analysis
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