RESUMO
The method of magnetic force microscopy was used to study the domain structure of various-thickness epitaxial Y2.95La0.05Fe5O12 iron-yttrium garnet films modified by high-dose implantation of N+ nitrogen ions. The results of multi-crystal x-ray diffractometry were analyzed, and a possible defect structure of garnets prior to and after implantation was identified. It was established that the reduction of magnetic losses observed after high-dose ion implantation is accompanied by the essential ordering of magnetic domains on the surface of implanted films. There is a direct dependence of electromagnetic properties on the dose of implanted atoms followed by a considerable sputtering and amorphization of the near-surface film layer and formation of a well-defined electromagnetic structure.