Tailoring Strain and Morphology of Core-Shell SiGe Nanowires by Low-Temperature Ge Condensation.

Selective oxidation of the silicon element of silicon germanium (SiGe) alloys during thermal oxidation is a very important and technologically relevant mechanism used to fabricate a variety of microelectronic devices. We develop here a simple integrative approach involving vapor-liquid-solid (VLS) growth followed by selective oxidation steps to the construction of core-shell nanowires and higher-level ordered systems with scalable configurations. We examine the selective oxidation/condensation process under nonequilibrium conditions that gives rise to spontaneous formation of core-shell structures by germanium condensation. We contrast this strategy that uses reaction-diffusion-segregation mechanisms to produce coherently strained structures with highly configurable geometry and abrupt interfaces with growth-based processes which lead to low strained systems with nonuniform composition, three-dimensional morphology, and broad core-shell interface. We specially focus on SiGe core-shell nanowires and demonstrate that they can have up to 70% Ge-rich shell and 2% homogeneous strain with core diameter as small as 14 nm. Key elements of the building process associated with this approach are identified with regard to existing theoretical models. Moreover, starting from results of ab initio calculations, we discuss the electronic structure of these novel nanostructures as well as their wide potential for advanced device applications.

Inversion Domain Boundaries in GaN Wires Revealed by Coherent Bragg Imaging.

Interfaces between polarity domains in nitride semiconductors, the so-called Inversion Domain Boundaries (IDB), have been widely described, both theoretically and experimentally, as perfect interfaces (without dislocations and vacancies). Although ideal planar IDBs are well documented, the understanding of their configurations and interactions inside crystals relies on perfect-interface assumptions. Here, we report on the microscopic configuration of IDBs inside n-doped gallium nitride wires revealed by coherent X-ray Bragg imaging. Complex IDB configurations are evidenced with 6 nm resolution and the absolute polarity of each domain is unambiguously identified. Picoscale displacements along and across the wire are directly extracted from several Bragg reflections using phase retrieval algorithms, revealing rigid relative displacements of the domains and the absence of microscopic strain away from the IDBs. More generally, this method offers an accurate inner view of the displacements and strain of interacting defects inside small crystals that may alter optoelectronic properties of semiconductor devices.

Stability of a Screw Dislocation in a ⟨011⟩ Copper Nanowire.

The stability of a screw dislocation in a free ⟨011⟩ copper nanowire is investigated using atomistic calculations. This study reveals a strong anisotropy of the Eshelby potential well (EPW) that traps the dislocation. Moreover the depth of the EPW is found to vanish when the radius of the nanowire decreases. It is demonstrated that this behavior is due to the dissociated state of the dislocation.

The first X-ray diffraction measurements on Mars.

The Mars Science Laboratory landed in Gale crater on Mars in August 2012, and the Curiosity rover then began field studies on its drive toward Mount Sharp, a central peak made of ancient sediments. CheMin is one of ten instruments on or inside the rover, all designed to provide detailed information on the rocks, soils and atmosphere in this region. CheMin is a miniaturized X-ray diffraction/X-ray fluorescence (XRD/XRF) instrument that uses transmission geometry with an energy-discriminating CCD detector. CheMin uses onboard standards for XRD and XRF calibration, and beryl:quartz mixtures constitute the primary XRD standards. Four samples have been analysed by CheMin, namely a soil sample, two samples drilled from mudstones and a sample drilled from a sandstone. Rietveld and full-pattern analysis of the XRD data reveal a complex mineralogy, with contributions from parent igneous rocks, amorphous components and several minerals relating to aqueous alteration. In particular, the mudstone samples all contain one or more phyllosilicates consistent with alteration in liquid water. In addition to quantitative mineralogy, Rietveld refinements also provide unit-cell parameters for the major phases, which can be used to infer the chemical compositions of individual minerals and, by difference, the composition of the amorphous component.

Structure of smectic defect cores: x-ray study of 8CB liquid crystal ultrathin films.

We study the structure of very thin liquid crystal films frustrated by antagonistic anchorings in the smectic phase. In a cylindrical geometry, the structure is dominated by the defects for film thicknesses smaller than 150 nm and the detailed topology of the defects' cores can be revealed by x-ray diffraction. They appear to be split in half tube-shaped rotating grain boundaries (RGB). We determine the RGB spatial extension and evaluate its energy per unit length. Both are significantly larger than the ones usually proposed in the literature.

Optical gratings formed in thin smectic films frustrated on a single crystalline substrate.

Through the combination of three different, complementary techniques (optical microscopy, x-ray diffraction and atomic force microscopy), we reveal the deformations inside thin smectic films frustrated between two interfaces imposing antagonistic anchorings. We study the model system, 4-n-octyl-4'-cyanobiphenyl (8CB) between MoS2 and air, which is characterized by the competition between homeotropic anchoring at air and planar unidirectional anchoring on the substrate, with thicknesses varying around 0.3 microm. Optical microscopy and x-ray diffraction demonstrate the continuous topology of smectic layers between the interfaces, which are stacked into periodic flattened hemicylinders. These latter are one-dimensional (1D) focal conic domains which form an optical grating in the smectic film, of a period ranging from 1 to 2.5 microm. The interpretation of our results through an energetic model, associated with the atomic force microscopy (AFM) measurements, shows the presence below a critical thickness of a new type of curvature wall between neighboring hemicylinders.

Bistable nematic and smectic anchoring in the liquid crystal octylcyanobiphenyl (8CB) adsorbed on a MoS2 single crystal.

We have studied the anchoring directions imposed on 4-n-octyl-4(')-cyanobiphenyl (8CB) smectic-A and nematic phases by a single crystal of molybdenum disulfide (MoS2). Combining optical microscopy and x-ray diffraction under grazing incidence we have demonstrated the occurrence of a bistable planar anchoring. A previous study of the two-dimensional (2D) network of adsorbed 8CB molecules under the liquid crystal film allows a direct connection to be made between the interface structure and the anchoring directions, demonstrating that bistability is induced by the presence of two dipolar groups in the skeleton of the 2D network. It is demonstrated that the Landau-de Gennes theory cannot account for the observed anchoring in the nematic phase. The Landau-de Gennes free energy has to be associated with a coupling with both the surface order and the MoS2 substrate to explain the experimental observations. The hypothesis of a nematic layer under the liquid crystal bulk is postulated in the smectic phase.