Hydroxyl ion absorption in on-chip high-Q resonators.

Thermal silica is a common dielectric used in all-silicon photonic circuits. Additionally, bound hydroxyl ions (Si-OH) can provide a significant component of optical loss in this material on account of the wet nature of the thermal oxidation process. A convenient way to quantify this loss relative to other mechanisms is through OH absorption at 1380 nm. Here, using ultra-high-quality factor (Q-factor) thermal-silica wedge microresonators, the OH absorption loss peak is measured and distinguished from the scattering loss baseline over a wavelength range from 680 nm to 1550 nm. Record-high on-chip resonator Q-factors are observed for near-visible and visible wavelengths, and the absorption limited Q-factor is as high as 8 billion in the telecom band. Hydroxyl ion content level around 2.4 ppm (weight) is inferred from both Q measurements and by secondary ion mass spectroscopy (SIMS) depth profiling.

Correlated self-heterodyne method for ultra-low-noise laser linewidth measurements.

Narrow-linewidth lasers are important to many applications spanning precision metrology to sensing systems. Characterization of these lasers requires precise measurements of their frequency noise spectra. Here we demonstrate a correlated self-heterodyne (COSH) method capable of measuring frequency noise as low as 0.01 Hz2/Hz at 1 MHz offset frequency. The measurement setup is characterized by both commercial and lab-built lasers, and features low optical power requirements, fast acquisition time and high intensity noise rejection.

Flattening laser frequency comb spectra with a high dynamic range, broadband spectral shaper on-a-chip.

Spectral shaping is critical to many fields of science. In astronomy for example, the detection of exoplanets via the Doppler effect hinges on the ability to calibrate a high resolution spectrograph. Laser frequency combs can be used for this, but the wildly varying intensity across the spectrum can make it impossible to optimally utilize the entire comb, leading to a reduced overall precision of calibration. To circumvent this, astronomical applications of laser frequency combs rely on a bulk optic setup which can flatten the output spectrum before sending it to the spectrograph. Such flatteners require complex and expensive optical elements like spatial light modulators and have non-negligible bench top footprints. Here we present an alternative in the form of an all-photonic spectral shaper that can be used to flatten the spectrum of a laser frequency comb. The device consists of a circuit etched into a silicon nitride wafer that supports an arrayed-waveguide grating to disperse the light over hundreds of nanometers in wavelength, followed by Mach-Zehnder interferometers to control the amplitude of each channel, thermo-optic phase modulators to phase the channels and a second arrayed-waveguide grating to recombine the spectrum. The demonstrator device operates from 1400 to 1800 nm (covering the astronomical H band), with twenty 20 nm wide channels. The device allows for nearly 40 dBs of dynamic modulation of the spectrum via the Mach-Zehnders , which is greater than that offered by most spatial light modulators. With a smooth spectrum light source (superluminescent diode), we reduced the static spectral variation to ∼3 dB, limited by the properties of the components used in the circuit. On a laser frequency comb which had strong spectral modulations, and some at high spatial frequencies, we nevertheless managed to reduce the modulation to ∼5 dBs, sufficient for astronomical applications. The size of the device is of the order of a US quarter, significantly cheaper than their bulk optic counter parts and will be beneficial to any area of science that requires spectral shaping over a broad range, with high dynamic range, including exoplanet detection.

Probing material absorption and optical nonlinearity of integrated photonic materials.

Optical microresonators with high quality (Q) factors are essential to a wide range of integrated photonic devices. Steady efforts have been directed towards increasing microresonator Q factors across a variety of platforms. With success in reducing microfabrication process-related optical loss as a limitation of Q, the ultimate attainable Q, as determined solely by the constituent microresonator material absorption, has come into focus. Here, we report measurements of the material-limited Q factors in several photonic material platforms. High-Q microresonators are fabricated from thin films of SiO2, Si3N4, Al0.2Ga0.8As, and Ta2O5. By using cavity-enhanced photothermal spectroscopy, the material-limited Q is determined. The method simultaneously measures the Kerr nonlinearity in each material and reveals how material nonlinearity and ultimate Q vary in a complementary fashion across photonic materials. Besides guiding microresonator design and material development in four material platforms, the results help establish performance limits in future photonic integrated systems.

Greater than one billion Q factor for on-chip microresonators.

High optical quality (Q) factors are critically important in optical microcavities, where performance in applications spanning nonlinear optics to cavity quantum electrodynamics is determined. Here, a record Q factor of over 1.1 billion is demonstrated for on-chip optical resonators. Using silica whispering-gallery resonators on silicon, Q-factor data is measured over wavelengths spanning the C/L bands (100 nm) and for a range of resonator sizes and mode families. A record low sub-milliwatt parametric oscillation threshold is also measured in 9 GHz free-spectral-range devices. The results show the potential for thermal silica on silicon as a resonator material.