Pyroelectric detector-based method for low uncertainty spectral irradiance and radiance responsivity calibrations in the infrared using tunable lasers.

The standard uncertainty of detector-based radiance and irradiance responsivity calibrations in the short-wave infrared (SWIR) traditionally has been limited to around 1% or higher by the poor spatial uniformity of detectors used to transfer the scale from radiant power. Pyroelectric detectors offer a solution that avoids the spatial uniformity uncertainty but also introduces additional complications due to alternating current (AC) measurement techniques. Herein, a new, to the best of our knowledge, method for low uncertainty irradiance responsivity calibrations in the SWIR is presented. An absolute spectral irradiance responsivity scale was placed on two pyroelectric detectors (PED) at wavelengths λ from 500 to 3400 nm. The total combined uncertainty (k=1) was ≈0.28% (>1000nm), 0.44% (900 nm), and 0.36% (≈950nm and <900nm) for PED #1 and 0.34% (>1000nm), 0.48% (900 nm), and 0.42% (≈950nm and <900nm) for PED #2. This was done by utilizing a demodulation technique to digitally analyze the time-dependent AC waveforms, which obviates the use of lock-in amplifiers and avoids associated additional uncertainty components.

Experimental observation of extremely weak optical scattering from an interlocking carbon nanotube array.

We experimentally demonstrate a nearly wavelength-independent optical reflection from an extremely rough carbon nanotube sample. The sample is made of a vertically aligned nanotube array, is a super dark material, and exhibits a near-perfect blackbody emission at T=450 K-600 K. No other material exhibits such optical properties, i.e., ultralow reflectance accompanied by a lack of wavelength scaling behavior. This observation is a result of the lowest ever measured reflectance (R=0.0003) of the sample over a broad infrared wavelength of 3 µm < λ < 13 µm. This discovery may be attributed to the unique interlocking surface of the nanotube array, consisting of both a global, large scale and a short-range randomness.

Standard reference material 2036 near-infrared reflection wavelength standard.

Standard Reference Material 2036 (SRM 2036) is a certified transfer standard intended for the verification and calibration of the wavelength/wavenumber scale of near-infrared (NIR) spectrometers operating in diffuse or trans-reflectance mode. SRM 2036 Near-Infrared Wavelength/Wavenumber Reflection Standard is a combination of a rare earth oxide glass of a composition similar to that of SRM 2035 Near-Infrared Transmission Wavelength/Wavenumber Standard and SRM 2065 Ultraviolet-Visible-Near-Infrared Transmission Wavelength/Wavenumber Standard, but is in physical contact with a piece of sintered poly(tetrafluoroethylene) (PTFE). The combination of glass contacted with a nearly ideal diffusely reflecting backing provides reflection-absorption bands that range from 15% R to 40% R. SRM 2036 is certified for the 10% band fraction air wavelength centroid location, (10%)B, of seven bands spanning the spectral region from 975 nm to 1946 nm. It is also certified for the vacuum wavenumber (10%)B of the same seven bands in the spectral region from 10 300 cm(-1) to 5130 cm(-1) at 8 cm(-1) resolution. Informational values are provided for the locations of thirteen additional bands from 334 nm to 804 nm.

Monte Carlo modeling of an integrating sphere reflectometer.

The Monte Carlo method has been applied to numerical modeling of an integrating sphere designed for hemispherical-directional reflectance factor measurements. It is shown that a conventional algorithm of backward ray tracing used for estimation of characteristics of the radiation field at a given point has slow convergence for small source-to-sphere-diameter ratios. A newly developed algorithm that substantially improves the convergence by calculation of direct source-induced irradiation for every point of diffuse reflection of rays traced is described. The method developed is applied to an integrating sphere reflectometer for the visible and infrared spectral ranges. Parametric studies of hemispherical radiance distributions for radiation incident onto the sample center were performed. The deviations of measured sample reflectance from the actual reflectance as a result of various factors were computed. The accuracy of the results, adequacy of the reflectance model, and other important aspects of the algorithm implementation are discussed.