Direct-writing of inverted domains in lithium niobate using a continuous wave ultra violet laser.

The inversion of ferroelectric domains in lithium niobate by a scanning focused ultra-violet laser beam (lambda = 244 nm) is demonstrated. The resulting domain patterns are interrogated using piezoresponse force microscopy and by chemical etching in hydrofluoric acid. Direct ultra-violet laser poling was observed in un-doped congruent, iron doped congruent and titanium in-diffused congruent lithium niobate single crystals. A model is proposed to explain the mechanism of domain inversion.

Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures.

The interpretation of ferroelectric domain images obtained with a piezoresponse force microscope (PFM) is discussed. The influence of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are described. We present experimental results to evidence our analysis of the influence of the background on the domain contrast in PFM images.

Cross-talk correction in atomic force microscopy.

Commercial atomic force microscopes usually use a position-sensitive photodiode to detect the motion of the cantilever via laser beam deflection. This readout technique makes it possible to measure bending and torsion of the cantilever separately. A slight angle between the orientation of the photodiode and the plane of the readout laser beam, however, causes false signals in both readout channels. This cross-talk may lead to misinterpretation of the acquired data. We demonstrate this fault with images recorded in contact mode on periodically poled ferroelectric crystals and present a simple electronic circuit to compensate for it. This circuit can correct for cross-talk with a bandwidth of approximately 1 MHz suppressing the the false signal to <<1%.

Critical assessment of the speckle statistics in fluctuation electron microscopy and comparison to electron diffraction.

The technique of fluctuation electron microscopy (FEM) is applied to thin films of amorphous germanium and of polycrystalline gold in a transmission electron microscope. Even though the method was introduced as a tool for quantitative analysis of structural fluctuations in amorphous materials, the basic principles are applicable to any disordered specimen independent of the dimension of disorder. Hence, we extended the technique of FEM to a well-known specimen, gold, whereby it was possible to reinterpret the results of the measurements on amorphous germanium. The hollow-cone dark field images, the statistical analysis of which is the basis of FEM, are examined with respect to the effects of frequency filtering, and are compared to electron diffraction. We find that the angular dependence of the normalised variance, as measured by FEM, yields information similar to the average intensity of hollow-cone dark field image series. Both plots are basically identical to a scan through a selected-area diffraction pattern convoluted by the corresponding angular resolution function. Hence, it appears questionable whether standard FEM analysis provides more information than the classical pair distribution function, which is experimentally limited to short-range order. Frequency selective analysis of the normalised variance, however, gives supplementary information on preferred inter-atomic distances related to the medium-range order of the specimen.