The Effect of Ti/Ta Ratio and Processing Routes on the Hardness and Elastic Modulus of Porous TiNbZrTa Alloys.

TiNbZrTa alloys are promising for multidisciplinary applications, such as refractory and biomedical purposes, due to their high thermal stability and non-toxicity. Hardness and elastic modulus are among the key features for their adequate industrial applications. The influence of porosity and Ti/Ta ratio were investigated on TiNbZrTa alloys produced by three different processing routes, i.e., (i) blend element and posterior press and sintering (BE + P&S); (ii) mechanical alloying with press and sintering (MA + P&S); and (iii) arc melting and casting. Porosity decreased in the following order: casting < MA + P&S < BE + P&S. The total porosity of alloys increased with increasing Ta contents, i.e., by lowering the Ti/Ta ratio. However, the Ti/Ta ratio did not considerably affect the bonding energy or the elastic modulus. Hardness was increased significantly in dense alloys compared to porous ones. However, porosity and Ti/Ta ratio did not show a clear trend in hardness among the porous alloys.

Modeling of Interface and Internal Disorder Applied to XRD Analysis of Ag-Based Nano-Multilayers.

Multilayered structures are a promising route to tailor electronic, magnetic, optical, and/or mechanical properties and durability of functional materials. Sputter deposition at room temperature, being an out-of-equilibrium process, introduces structural defects and confers to these nanosystems an intrinsic thermodynamical instability. As-deposited materials exhibit a large amount of internal atomic displacements within each constituent block as well as severe interface roughness between different layers. To access and characterize the internal multilayer disorder and its thermal evolution, X-ray diffraction investigation and analysis are performed systematically at differently grown Ag-Ge/aluminum nitride (AlN) multilayers (co-deposited, sequentially deposited with and without radio frequency (RF) bias) samples and after high-temperature annealing treatment. We report here on model calculations based on a kinematic formalism describing the displacement disorder both within the multilayer blocks and at the interfaces to reproduce the experimental X-ray diffraction intensities. Mixing and displacements at the interface are found to be considerably reduced after thermal treatment for co- and sequentially deposited Ag-Ge/AlN samples. The application of a RF bias during the deposition causes the highest interface mixing and introduces random intercalates in the AlN layers. X-ray analysis is contrasted to transmission electron microscopy pictures to validate the approach.