RESUMO
Magnetometry and ferromagnetic resonance are used to quantitatively study magnetic anisotropy with an easy axis both in the film plane and perpendicular to it. In the study of single-layer and multilayer permalloy films, it is demonstrated that these methods make it possible not only to investigate the average field of perpendicular and in-plane anisotropy, but also to characterize their inhomogeneity. It is shown that the quantitative data from direct integral and local measurements of magnetic anisotropy are consistent with the direct and indirect estimates based on processing of the magnetization curves. The possibility of estimating the perpendicular magnetic anisotropy constant from the width of stripe domains in a film in the transcritical state is demonstrated. The average in-plane magnetic anisotropy field of permalloy films prepared by magnetron sputtering onto a Corning glass is almost unchanged with the thickness of a single-layer film. The inhomogeneity of the perpendicular anisotropy field for a 500 nm film is greater than that for a 100 nm film, and for a multilayer film with a total permalloy thickness of 500 nm, it is greater than that for a homogeneous film of the same thickness.
RESUMO
Magnetization reversal processes in the NiFe/FeMn exchange biased structures with various antiferromagnetic layer thicknesses (0-50 nm) and glass substrate temperatures (17-600 °C) during deposition were investigated in detail. Magnetic measurements were performed in the temperature range from 80 K up to 300 K. Hysteresis loop asymmetry was found at temperatures lower than 150 K for the samples with an antiferromagnetic layer thickness of more than 10 nm. The average grain size of FeMn was found to increase with the AFM layer increase, and to decrease with the substrate temperature increase. Hysteresis loop asymmetry was explained in terms of the exchange spring model in the antiferromagnetic layer.
RESUMO
Multilayered [FeNi (100 nm)/Cu (3 nm)]5/Cu (500 nm)/[Cu (3 nm)/[FeNi (100 nm)]5 structures were used as sensitive elements of the magnetoimpedance (MI) sensor prototype for model experiments of the detection of magnetic particles in blood vessel. Non-ferromagnetic cylindrical polymer rod with a small magnetic inclusion was used as a sample mimicking thrombus in a blood vessel. The polymer rod was made of epoxy resin with an inclusion of an epoxy composite containing 30% weight fraction of commercial magnetite microparticles. The position of the magnetic inclusion mimicking thrombus in the blood vessel was detected by the measurements of the stray magnetic fields of microparticles using MI element. Changes of the MI ratio in the presence of composite can be characterized by the shift and the decrease of the maximum value of the MI. We were able to detect the position of the magnetic composite sample mimicking thrombus in blood vessels. Comsol modeling was successfully used for the analysis of the obtained experimental results and the understanding of the origin the MI sensitivity in proposed configuration. We describe possible applications of studied configuration of MI detection for biomedical applications in the field of thrombus state evaluation and therapy.
Assuntos
Técnicas Biossensoriais , Óxido Ferroso-Férrico , Campos Magnéticos , MagnetismoRESUMO
A growing variety of microelectronic devices and magnetic field sensors as well as a trend of miniaturization demands the development of low-dimensional magnetic materials and nanostructures. Among them, soft magnetic thin films of Finemet alloys are appropriate materials for sensor and actuator devices. Therefore, one of the important directions of the research is the optimization of thin film magnetic properties. In this study, the structural transformations of the Fe73.5Nb3Cu1Si13.5B9 and Fe72.5Nb1.5Mo2Cu1.1Si14.2B8.7 films of 100, 150 and 200 nm thicknesses were comparatively analyzed together with their magnetic properties and magnetic anisotropy. The thin films were prepared using the ion-plasma sputtering technique. The crystallization process was studied by certified X-ray diffraction (XRD) methods. The kinetics of crystallization was observed due to the temperature X-ray diffraction (TDX) analysis. Magnetic properties of the films were studied by the magneto-optical Kerr microscopy. Based on the TDX data the delay of the onset crystallization of the films with its thickness decreasing was shown. Furthermore, the onset crystallization of the 150 and 200 nm films began at the temperature of about 400-420 °C showing rapid grain growth up to the size of 16-20 nm. The best magnetic properties of the films were formed after crystallization after the heat treatment at 350-400 °C when the stress relaxation took place.