The x-ray calibration facility of the laser integration line in the 0.9-10 keV range: the high energy x-ray source and some applications.

The laser integration line (LIL) located at CEA-CESTA is equipped with x-ray plasma diagnostics using different kinds of x-ray components such as filters, mirrors, crystals, detectors, and cameras. The CEA-DAM of Arpajon is currently developing x-ray calibration methods and carrying out absolute calibration of LIL x-ray photodetectors. To guarantee LIL measurements, detectors such as x-ray cameras must be regularly calibrated close to the facility. A new x-ray facility is currently available to perform these absolute x-ray calibrations. This paper presents the x-ray tube based high energy x-ray source delivering x-ray energies ranging from 0.9 to 10 keV by means of an anode barrel. The purpose of this source is mainly to calibrate LIL x-ray cameras but it can also be used to measure x-ray filter transmission of plasma diagnostics. Different x-ray absolute calibrations such as x-ray streak and framing camera yields, x-ray charge-coupled device quantum efficiencies, and x-ray filter transmissions are presented in this paper. A x-ray flat photocathode detector sensitivity calibration recently performed for a CEA Z-pinch facility is also presented.

X-ray imaging with grazing-incidence microscopes developed for the LIL program.

This article describes x-ray imaging with grazing-incidence microscopes, developed for the experimental program carried out on the Ligne d'Integration Laser (LIL) facility [J. P. Le Breton et al., Inertial Fusion Sciences and Applications 2001 (Elsevier, Paris, 2002), pp. 856-862] (24 kJ, UV-0.35 nm). The design includes a large target-to-microscope (400-700 mm) distance required by the x-ray ablation issues anticipated on the Laser MégaJoule facility [P. A. Holstein et al., Laser Part. Beams 17, 403 (1999)] (1.8 MJ) which is under construction. Two eight-image Kirkpatrick-Baez microscopes [P. Kirkpatrick and A. V. Baez J. Opt. Soc. Am. 38, 766 (1948)] with different spectral wavelength ranges and with a 400 mm source-to-mirror distance image the target on a custom-built framing camera (time resolution of approximately 80 ps). The soft x-ray version microscope is sensitive below 1 keV and its spatial resolution is better than 30 microm over a 2-mm-diam region. The hard x-ray version microscope has a 10 microm resolution over an 800-microm-diam region and is sensitive in the 1-5 keV energy range. Two other x-ray microscopes based on an association of toroidal/spherical surfaces (T/S microscopes) produce an image on a streak camera with a spatial resolution better than 30 microm over a 3 mm field of view in the direction of the camera slit. Both microscopes have been designed to have, respectively, a maximum sensitivity in the 0.1-1 and 1-5 keV energy range. We present the original design of these four microscopes and their test on a dc x-ray tube in the laboratory. The diagnostics were successfully used on LIL first experiments early in 2005. Results of soft x-ray imaging of a radiative jet during conical shaped laser interaction are shown.