RESUMO
The article describes the results of Raman spectroscopy and SERS for the study of fluorescent components of Baltic amber via the extraction method. Using SERS, it was possible to confirm the presence of anthracene derivatives in amber: tetracene and benzanthracene. It has been shown that SERS methods are effective for the detection of aromatic compounds; they increase the registered Raman signal and make it possible to identify peaks characteristic of the compounds under study. By combining experimental methods with DFT simulations, anthracene derivatives were modeled and confirmed to be present in the structure of Baltic amber. A combination of the proposed methods can be used to distinguish between different types of amber and isolate the necessary amber components. The obtained results are promising for compiling spectral maps of ambers for their possible classification by their place of origin.
RESUMO
This paper describes a detailed study of the spectral homogeneity of human platelets using Surface-enhanced Raman spectroscopy (SERS). We used a combined approach based on multivariate methods as principal component analysis and pair correlation algorithms to investigate platelets spectral properties. The correlation coefficients for each sample have been calculated, and the average coefficient of determination has been estimated. The high degree of spectral homogeneity inside one probe and between them has been revealed. The prospects of obtained results usage for pathologies based on platelet conformations during cardiovascular diseases have been demonstrated.
Assuntos
Plaquetas , Análise Espectral Raman , Humanos , Análise de Componente PrincipalRESUMO
We demonstrate that ion-beam lithography can be applied to the fabrication of rotationally parabolic refractive diamond X-ray micro-lenses that are of interest to the field of high-resolution X-ray focusing and microscopy. Three single half-lenses with curvature radii of 4.8 µm were produced and stacked to form a compound refractive lens, which provided diffraction-limited focusing of X-ray radiation at the P14 beamline of PETRA-III (DESY). As shown with SEM, the lenses are free of expressed low- and high-frequency shape modulations with a figure error of < 200 nm and surface roughness of 30 nm. Precise micro-manipulation and stacking of individual lenses are demonstrated, which opens up new opportunities for compact X-ray microscopy with nanometer resolution.
RESUMO
Beryllium is one of the most transparent materials to hard X-ray radiation and, as a direct consequence, it is the main material for the fabrication of X-ray refractive optics and instrumentation for synchrotron radiation sources and free-electron laser facilities. However, it is known that almost all beryllium currently in use is polycrystalline material. In this paper, the influence of the microstructure of different beryllium grades on the optical properties of X-ray refractive lenses is studied. The experiments were performed at the ESRF ID06 beamline in X-ray coherent transmission microscopy mode in the near- and far-fields. Two sets of refractive lenses made of beryllium O-30-H and IS-50M grades with different internal microstructure were used. It was found that both beryllium grades have a strongly inhomogeneous structure, which inevitably produces speckle patterns under coherent illumination in imaging experiments. It was shown that fine-grained beryllium O-30-H is better suited for imaging applications, whereas beryllium IS-50M with a relatively large grain microstructure is more appropriate for focusing and collimation of X-rays. A discussion on the requirements for X-ray optical materials used at the third- and fourth-generation synchrotrons is also presented.
RESUMO
A new ultra-compact transfocator (UCTF) based on X-ray compound refractive lenses (CRLs) is presented. The device can be used to change the number of one- and two-dimensional focusing CRLs by moving the individual parabolic lenses one-by-one independently, thus providing permanent energy and focal-length tunability for scanning and full-field X-ray microscopy applications. The small overall size and light weight of the device allow it to be integrated in any synchrotron beamline, while even simplifying the experimental layout. The UCTF was tested at the Excillium MetalJet microfocus X-ray source and at the P14 EMBL (PETRA-III) beamline, demonstrating high mechanical stability and lens positioning repeatability.
RESUMO
The current work represents the first implementation of Zernike phase contrast for compound refractive lens based x-ray microscopy, and also the first successful Zernike phase contrast experiment at photon energies above 12â¯keV. Phase contrast was achieved by fitting a compound refractive lens with a circular phase plate. The resolution is demonstrated to be sub-micron, and can be improved using already existing technology. The possibility of combining the technique with polychromatic radiation is considered, and a preliminary test experiment was performed with positive results.
RESUMO
Beryllium, being one of the most transparent materials to X-ray radiation, has become the material of choice for X-ray optics instrumentation at synchrotron radiation sources and free-electron laser facilities. However, there are concerns due to its high toxicity and, consequently, there is a need for special safety regulations. The authors propose to apply protective coatings in order to seal off beryllium from the ambient atmosphere, thus preventing degradation processes providing additional protection for users and prolonging the service time of the optical elements. This paper presents durability test results for Be windows coated with atomic-layer-deposition alumina layers run at the European Synchrotron Radiation Facility. Expositions were performed under monochromatic, pink and white beams, establishing conditions that the samples could tolerate without radiation damage. X-ray treatment was implemented in various environments, i.e. vacuum, helium, nitrogen, argon and dry air at different pressures. Post-process analysis revealed their efficiency for monochromatic and pink beams.
RESUMO
This paper reports a special device called a `speckle suppressor', which contains a highly porous nanoberyllium plate squeezed between two beryllium windows. The insertion of the speckle suppressor in an X-ray beam allows manipulation of the spatial coherence length, thus changing the effective source size and removing the undesirable speckle structure in X-ray imaging experiments almost without beam attenuation. The absorption of the nanoberyllium plate is below 1% for 1â mm thickness at 12â keV. The speckle suppressor was tested on the ID06 ESRF beamline with X-rays in the energy range from 9 to 15â keV. It was applied for the transformation of the phase-amplitude contrast to the pure amplitude contrast in full-field microscopy.