Your browser doesn't support javascript.
loading
Mostrar: 20 | 50 | 100
Resultados 1 - 2 de 2
Filtrar
Mais filtros








Base de dados
Intervalo de ano de publicação
1.
Phys Rev Lett ; 108(12): 120801, 2012 Mar 23.
Artigo em Inglês | MEDLINE | ID: mdl-22540567

RESUMO

A cavity optomechanical magnetometer is demonstrated. The magnetic-field-induced expansion of a magnetostrictive material is resonantly transduced onto the physical structure of a highly compliant optical microresonator and read out optically with ultrahigh sensitivity. A peak magnetic field sensitivity of 400 nT Hz(-1/2) is achieved, with theoretical modeling predicting the possibility of sensitivities below 1 pT Hz(-1/2). This chip-based magnetometer combines high sensitivity and large dynamic range with small size and room temperature operation.


Assuntos
Magnetometria/instrumentação , Óptica e Fotônica/instrumentação , Modelos Teóricos
2.
Rev Sci Instrum ; 81(10): 105105, 2010 Oct.
Artigo em Inglês | MEDLINE | ID: mdl-21034117

RESUMO

We present an upgrade of the available measurement techniques at the wiggler beamline BW4 of the Hamburger Synchrotronstrahlungslabor (HASYLAB) to grazing incidence wide angle x-ray scattering (GIWAXS). GIWAXS refers to an x-ray diffraction method, which, based on the measurement geometry, is perfectly suited for the investigation of the material crystallinity of surfaces and thin films. It is shown that the overall experimental GIWAXS setup employing a movable CCD-detector provides the capability of reliable and reproducible diffraction measurements in grazing incidence geometry. Furthermore, the potential usage of an additional detector enables the simultaneous or successive measurement of GIWAXS and grazing incidence small angle x-ray scattering (GISAXS). The new capability is illustrated by the microbeam GIWAXS measurement of a thin film of the conjugated polymer poly(3-octylthiophene) (P3OT). The investigation reveals the semicrystalline nature of the P3OT film by a clear identification of the wide angle scattering reflexes up to the third order in the [100]-direction as well as the first order in the [010]-direction. The corresponding microbeam GISAXS measurement on the present morphology complements the characterization yielding the complete sample information from subnanometer up to micrometer length scales.

SELEÇÃO DE REFERÊNCIAS
DETALHE DA PESQUISA