1.
J Res Natl Inst Stand Technol
; 100(6): 711-715, 1995.
Artigo
em Inglês
| MEDLINE
| ID: mdl-29151771
2.
Rev Sci Instrum
; 49(12): 1748, 1978 Dec.
Artigo
em Inglês
| MEDLINE
| ID: mdl-18699053
RESUMO
Charge buildup on insulating specimens examined by the scanning Auger microprobe cannot be controlled by conventional surface metal coating techniques which hide the signal of interest. Instead, a simple TEM grid of appropriate geometry can be used as a mask during deposition to leave untouched select spots for analysis.