The influence of ionic strength on the interaction of viruses with charged surfaces under environmental conditions.

The influence of ionic strength on the electrostatic interaction of viruses with environmentally relevant surfaces was determined for three viruses, MS2, Q beta, and Norwalk. The virus is modeled as a particle comprised of ionizable amino acid residues in a shell surrounding a spherical RNA core of negative charge, these charges being compensated for by a Coulomb screening due to intercalated ions. A second model of the virus involving surface charges only is included for comparison. Surface potential calculations for each of the viruses show excellent agreement with electrophoretic mobility and zeta potential measurements as a function of pH. The environmental surface is modeled as a homogeneous plane held at constant potential with and without a finite region (patch) of opposite potential. The results indicate that the electrostatic interaction between the virus and the oppositely charged patch is significantly influenced by the conditions of ionic strength, pH and size of the patch. Specifically, at pH 7, the Norwalk virus interacts more strongly with the patch than MS2 (approximately 51 vs approximately 9kT) but at pH 5, the Norwalk-surface interaction is negligible while that of MS2 is approximately 5.9kT. The resulting ramifications for the use of MS2 as a surrogate for Norwalk are discussed.

Investigation of pyrochlore-based U-bearing ceramic nuclear waste: uranium leaching test and TEM observation.

A durable titanate ceramic waste form (Synroc) with pyrochlore (Ca(U,Pu)Ti2O7) and zirconolite (CaZrTi2O7) as major crystalline phases has been considered to be a candidate for immobilizing various high-level wastes containing fissile elements (239Pu and 235U). Transmission electron microscopy study of a sintered ceramic with stoichiometry of Ca(U(0.5)Ce(0.25)Hf(0.25))Ti2O7 shows the material contains both pyrochlore and zirconolite phases and structural intergrowth of zirconolite lamellae within pyrochlore. The (001) plane of zirconolite is parallel to the (111) plane of pyrochlore because of their structural similarities. The pyrochlore is relatively rich in U, Ce, and Ca with respect to the coexisting zirconolite. Average compositions for the coexisting pyrochlore and zirconolite at 1350 degrees C are Ca(1.01)(Ce3+(0.13)Ce4+(0.19)U(0.52)Hf(0.18))(Ti(1.95)Hf(0.05))O7 (with U/(U + Hf) = 0.72) and (Ca(0.91)Ce(0.09))(Ce3+(0.08)U(0.26)Hf(0.66)Ti(0.01))Ti(2.00)O7 (with U/(U + Hf) = 0.28), respectively. A single pyrochlore (Ca(U,Hf)Ti2O7) phase may be synthesized at 1350 degrees C if the ratio of U/(U + Hf) is greater than 0.72, and a single zirconolite (Ca(Hf,U)Ti2O7) phase may be synthesized at 1350 degrees C if the ratio of U/(U + Hf) is less than 0.28. The synthesized products were used for dissolution tests. The single-pass flow-through dissolution tests show that the dissolution of the U-bearing pyrochlore is incongruent. All the elements are released at differing rates. The dissolution data also show a decrease in rate with run time. The results indicate that a diffusion-controlled process may play a key role during the release of U. TEM observation of the leached pyrochlore directly proves that an amorphous leached layer that is rich in Ti and Hf formed on the surface after the ceramic was leached in pH 4 buffered solution for 835 days. The thickness of the layer ranges from 6 to 10 nm. A nanocrystalline TiO2 phase also forms in the leached layer. The U leaching rate (g/(m2 day)) in acidic solutions can be expressed as log(NR) = -5.36-0.20 pH, where NR is the normalized rate. Conservative leaching rates of uranium [log(NR)] for the U-bearing ceramic at pH 2 and pH 4 solutions are -5.76 and -6.16 g/(m2 day), respectively. The results show that the U release rate of the ceramic waste is 10 times slower than that of defense high-level waste glass and about 1000 times slower than that of spent fuel. The pyrochlore-based ceramic is an ideal waste form for immobilizing long-lived radionuclides of 239Pu and 235U due to the Ti- and Hf-rich leached layer that forms on the ceramic surface. The leached layer functions as a protective layer and therefore reduces the leaching rate as thickness of the leached layer increases.