X-ray phase-contrast imaging at 100†keV on a conventional source.

X-ray grating interferometry is a promising imaging technique sensitive to attenuation, refraction and scattering of the radiation. Applications of this technique in the energy range between 80 and 150 keV pose severe technical challenges, and are still mostly unexplored. Phase-contrast X-ray imaging at such high energies is of relevant scientific and industrial interest, in particular for the investigation of strongly absorbing or thick materials as well as for medical imaging. Here we show the successful implementation of a Talbot-Lau interferometer operated at 100 keV using a conventional X-ray tube and a compact geometry, with a total length of 54 cm. We present the edge-on illumination of the gratings in order to overcome the current fabrication limits. Finally, the curved structures match the beam divergence and allow a large field of view on a short and efficient setup.

Comparison of two x-ray phase-contrast imaging methods with a microfocus source.

We present a comparison for high-resolution imaging with a laboratory source between grating-based (GBI) and propagation-based (PBI) x-ray phase-contrast imaging. The comparison is done through simulations and experiments using a liquid-metal-jet x-ray microfocus source. Radiation doses required for detection in projection images are simulated as a function of the diameter of a cylindrical sample. Using monochromatic radiation, simulations show a lower dose requirement for PBI for small object features and a lower dose for GBI for larger object features. Using polychromatic radiation, such as that from a laboratory microfocus source, experiments and simulations show a lower dose requirement for PBI for a large range of feature sizes. Tested on a biological sample, GBI shows higher noise levels than PBI, but its advantage of quantitative refractive index reconstruction for multi-material samples becomes apparent.

Sensitivity of X-ray grating interferometry.

It is known that the sensitivity of X-ray phase-contrast grating interferometry with regard to electron density variations present in the sample is related to the minimum detectable refraction angle. In this article a numerical framework is developed that allows for a realistic and quantitative determination of the sensitivity. The framework is validated by comparisons with experimental results and then used for the quantification of several influences on the sensitivity, such as spatial coherence or the number of phase step images. In particular, we identify the ideal inter-grating distance with respect to the highest sensitivity for parallel beam geometry. This knowledge will help to optimize existing synchrotron-based grating interferometry setups.