Exchange bias and domain evolution at 10 nm scales.

Schmid, I; Marioni, M A; Kappenberger, P; Romer, S; Parlinska-Wojtan, M; Hug, H J; Hellwig, O; Carey, M J; Fullerton, E E.

Affiliation

Schmid I; Empa, Swiss Federal Institute for Materials Testing and Research, CH-8600 Dübendorf, Switzerland.

Phys Rev Lett ; 105(19): 197201, 2010 Nov 05.

Article in En | MEDLINE | ID: mdl-21231192

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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2010 Document type: Article

Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2010 Document type: Article