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Depth resolved lattice-charge coupling in epitaxial BiFeO3 thin film.
Lee, Hyeon Jun; Lee, Sung Su; Kwak, Jeong Hun; Kim, Young-Min; Jeong, Hu Young; Borisevich, Albina Y; Lee, Su Yong; Noh, Do Young; Kwon, Owoong; Kim, Yunseok; Jo, Ji Young.
Affiliation
  • Lee HJ; School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, Korea.
  • Lee SS; School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, Korea.
  • Kwak JH; School of Materials Science and Engineering, Gwangju Institute of Science and Technology, Gwangju 61005, Korea.
  • Kim YM; Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Korea.
  • Jeong HY; Center for Integrated Nanostructure Physics, Institute for Basic Science (IBS), Suwon 16419, Korea.
  • Borisevich AY; UNIST Central Research Facilities, Ulsan National Institute of Science and Technology, Ulsan 44919, Korea.
  • Lee SY; Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, United States.
  • Noh DY; Pohang Accelerator Laboratory, Pohang 37673, Korea.
  • Kwon O; Department of Physics and Photon Science, Gwangju Institute of Science and Technology, Gwangju 61005, Korea.
  • Kim Y; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, Korea.
  • Jo JY; School of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon 16419, Korea.
Sci Rep ; 6: 38724, 2016 12 08.
Article in En | MEDLINE | ID: mdl-27929103
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Qualitative_research Language: En Journal: Sci Rep Year: 2016 Document type: Article
Fulltext
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PubMed Links
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Qualitative_research Language: En Journal: Sci Rep Year: 2016 Document type: Article