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The future of two-dimensional semiconductors beyond Moore's law.
Kim, Ki Seok; Kwon, Junyoung; Ryu, Huije; Kim, Changhyun; Kim, Hyunseok; Lee, Eun-Kyu; Lee, Doyoon; Seo, Seunghwan; Han, Ne Myo; Suh, Jun Min; Kim, Jekyung; Song, Min-Kyu; Lee, Sangho; Seol, Minsu; Kim, Jeehwan.
Affiliation
  • Kim KS; Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Kwon J; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Ryu H; Samsung Advanced Institute of Technology, Samsung Electronics Co. Ltd, Suwon, Korea.
  • Kim C; Samsung Advanced Institute of Technology, Samsung Electronics Co. Ltd, Suwon, Korea.
  • Kim H; Samsung Advanced Institute of Technology, Samsung Electronics Co. Ltd, Suwon, Korea.
  • Lee EK; Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Lee D; Department of Electrical and Computer Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
  • Seo S; Samsung Advanced Institute of Technology, Samsung Electronics Co. Ltd, Suwon, Korea.
  • Han NM; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Suh JM; Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Kim J; Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Song MK; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Lee S; Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Seol M; Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA, USA.
  • Kim J; Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Nat Nanotechnol ; 2024 Jul 01.
Article in En | MEDLINE | ID: mdl-38951597
ABSTRACT
The primary challenge facing silicon-based electronics, crucial for modern technological progress, is difficulty in dimensional scaling. This stems from a severe deterioration of transistor performance due to carrier scattering when silicon thickness is reduced below a few nanometres. Atomically thin two-dimensional (2D) semiconductors still maintain their electrical characteristics even at sub-nanometre scales and offer the potential for monolithic three-dimensional (3D) integration. Here we explore a strategic shift aimed at addressing the scaling bottleneck of silicon by adopting 2D semiconductors as new channel materials. Examining both academic and industrial viewpoints, we delve into the latest trends in channel materials, the integration of metal contacts and gate dielectrics, and offer insights into the emerging landscape of industrializing 2D semiconductor-based transistors for monolithic 3D integration.

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Nanotechnol Year: 2024 Document type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Nat Nanotechnol Year: 2024 Document type: Article