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AC Zeeman effect in microfabricated surface traps.
Ivory, M; Nordquist, C D; Young, K; Hogle, C W; Clark, S M; Revelle, M C.
Affiliation
  • Ivory M; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  • Nordquist CD; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  • Young K; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  • Hogle CW; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  • Clark SM; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
  • Revelle MC; Sandia National Laboratories, Albuquerque, New Mexico 87185, USA.
Rev Sci Instrum ; 95(9)2024 Sep 01.
Article in En | MEDLINE | ID: mdl-39269236
ABSTRACT
Quantum processors and atomic clocks based on trapped ions often utilize an ion's hyperfine transition as the qubit state or frequency reference, respectively. These states are a good choice because they are insensitive in first order to magnetic field fluctuations, leading to long coherence times and stable frequency splittings. In trapped ions, however, these states are still subject to the second order AC Zeeman effect due to the necessary presence of an oscillating magnetic field used to confine the ions in a Paul trap configuration. Here, we measure the frequency shift of the 2S1/2 hyperfine transition of a 171Yb+ ion caused by the radio frequency (RF) electromagnetic field used to create confinement in several microfabricated surface trap designs. By comparing different trap designs, we show that two key design modifications significantly reduce the AC Zeeman effect experienced by the ion (1) an RF ground layer routed directly below the entire RF electrode, and (2) a symmetric RF electrode. Both of these changes lead to better cancellation of the AC magnetic field and, thus, overall reduced frequency shifts due to the AC Zeeman effect and reduced variation across the device. These improvements enable a more homogeneous environment for quantum computing and can reduce errors for precision applications such as atomic clocks.

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2024 Document type: Article

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: Rev Sci Instrum Year: 2024 Document type: Article