Nanobits: customizable scanning probe tips.
Nanotechnology
; 20(39): 395703, 2009 Sep 30.
Article
em En
| MEDLINE
| ID: mdl-19724112
ABSTRACT
We present here a proof-of-principle study of scanning probe tips defined by planar nanolithography and integrated with AFM probes using nanomanipulation. The so-called 'nanobits' are 2-4 microm long and 120-150 nm thin flakes of Si(3)N(4) or SiO(2), fabricated by electron beam lithography and standard silicon processing. Using a microgripper they were detached from an array and fixed to a standard pyramidal AFM probe or alternatively inserted into a tipless cantilever equipped with a narrow slit. The nanobit-enhanced probes were used for imaging of deep trenches, without visible deformation, wear or dislocation of the tips of the nanobit after several scans. This approach allows an unprecedented freedom in adapting the shape and size of scanning probe tips to the surface topology or to the specific application.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
Nanotechnology
Ano de publicação:
2009
Tipo de documento:
Article