Mid-infrared near-field spectroscopy.
Opt Express
; 17(24): 21794-801, 2009 Nov 23.
Article
em En
| MEDLINE
| ID: mdl-19997423
ABSTRACT
We demonstrate continuous infrared spectra from 20 nm sample spots, by combining dispersive Fourier-transform infrared spectroscopy (FTIR) with scattering near-field microscopy (s-SNOM). With the "apertureless" tip of a standard AFM cantilever in one arm of a Michelson interferometer the spectra arise simultaneously in amplitude and phase. The effect of near-field phonon resonance of SiC is used to verify background-free s-SNOM operation, and to determine the absolute scattering efficiency, at 6 cm(-1) spectral resolution. We further report first evidence of free-induction decay from a scatterer composed of parts coupled by near-fields. This is possible only with broadband illumination. It offers a new, unique tool to discriminate against background scattering artifacts.
Texto completo:
1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Espectrofotometria Infravermelho
/
Microscopia de Força Atômica
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Óptica e Fotônica
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Interferometria
Idioma:
En
Revista:
Opt Express
Ano de publicação:
2009
Tipo de documento:
Article