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Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards.
Svensen, Oyvind; Kildemo, Morten; Maria, Jerome; Stamnes, Jakob J; Frette, Øyvind.
Afiliação
  • Svensen O; Department of Physics and Technology, University of Bergen, P.O. Box 7803, N-5020 Bergen, Norway. oyvind.svensen@projectiondesign.com
Opt Express ; 20(14): 15045-53, 2012 Jul 02.
Article em En | MEDLINE | ID: mdl-22772200
ABSTRACT
The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup was a Mueller matrix ellipsometer, by which measurements were performed for scattering angles measured relative to the normal of the Spectralon surface from -90° to 90° sampled at every 2.5° for an illumination wavelength of 532 nm. Previously, the polarization of light scattered from Spectralon white reflectance standards was measured only for four of the elements of the Muller matrix. As in previous investigations, the reflection properties of the Spectralon white reflectance standard was found to be close to those of a Lambertian surface for small scattering and illumination angles. At large scattering and illumination angles, all elements of the Mueller matrix were found to deviate from those of a Lambertian surface. A simple empirical model with only two parameters, was developed, and used to simulate the measured results with fairly good accuracy.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Opt Express Ano de publicação: 2012 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Opt Express Ano de publicação: 2012 Tipo de documento: Article