Effect of the thin-film limit on the measurable optical properties of graphene.

Holovský, Jakub; Nicolay, Sylvain; De Wolf, Stefaan; Ballif, Christophe

Holovský, Jakub; Nicolay, Sylvain; De Wolf, Stefaan; Ballif, Christophe.

Afiliação

Holovský J; Institute of Physics of the Academy of Sciences of the Czech Republic, Cukrovarnická 10, 162 00 Praha, Czech Republic.
Nicolay S; CTU in Prague, Faculty of Electrical Engineering, Technická 2, 166 27 Prague, Czech Republic.
De Wolf S; École Polytechnique Fédérale de Lausanne (EPFL), Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory, Maladière 71, CH-2000 Neuchâtel, Switzerland.
Ballif C; École Polytechnique Fédérale de Lausanne (EPFL), Institute of Microengineering (IMT), Photovoltaics and Thin-Film Electronics Laboratory, Maladière 71, CH-2000 Neuchâtel, Switzerland.

Sci Rep ; 5: 15684, 2015 Oct 28.

Article em En | MEDLINE | ID: mdl-26507421

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2015 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2015 Tipo de documento: Article