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Significance of the double-layer capacitor effect in polar rubbery dielectrics and exceptionally stable low-voltage high transconductance organic transistors.
Wang, Chao; Lee, Wen-Ya; Kong, Desheng; Pfattner, Raphael; Schweicher, Guillaume; Nakajima, Reina; Lu, Chien; Mei, Jianguo; Lee, Tae Hoon; Wu, Hung-Chin; Lopez, Jeffery; Diao, Ying; Gu, Xiaodan; Himmelberger, Scott; Niu, Weijun; Matthews, James R; He, Mingqian; Salleo, Alberto; Nishi, Yoshio; Bao, Zhenan.
Afiliação
  • Wang C; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Lee WY; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Kong D; Department of Chemical Engineering and Biotechnology, National Taipei University of Technology, Taipei 106, Taiwan (ROC).
  • Pfattner R; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Schweicher G; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Nakajima R; Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), and Networking Research Center on Bioengineering, Biomaterials and Nanomedicine (CIBER-BBN), Campus UAB, 08193 Bellaterra, Spain.
  • Lu C; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Mei J; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Lee TH; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Wu HC; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Lopez J; Department of Electrical Engineering, Stanford University, Stanford, California 94305, USA.
  • Diao Y; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Gu X; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Himmelberger S; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Niu W; Department of Chemical Engineering, Stanford University, Stanford, California 94305, USA.
  • Matthews JR; Department of Material Sciences &Engineering, Stanford University, Stanford, California 94305, USA.
  • He M; Corning Incorporated, SP-FR-06-1, Corning, NY 14831, USA.
  • Salleo A; Corning Incorporated, SP-FR-06-1, Corning, NY 14831, USA.
  • Nishi Y; Corning Incorporated, SP-FR-06-1, Corning, NY 14831, USA.
  • Bao Z; Department of Material Sciences &Engineering, Stanford University, Stanford, California 94305, USA.
Sci Rep ; 5: 17849, 2015 Dec 14.
Article em En | MEDLINE | ID: mdl-26658331
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2015 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2015 Tipo de documento: Article