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Electronic Properties of High-Quality Epitaxial Topological Dirac Semimetal Thin Films.
Hellerstedt, Jack; Edmonds, Mark T; Ramakrishnan, Navneeth; Liu, Chang; Weber, Bent; Tadich, Anton; O'Donnell, Kane M; Adam, Shaffique; Fuhrer, Michael S.
Afiliação
  • Hellerstedt J; School of Physics and Astronomy and Monash Centre for Atomically Thin Materials, Monash University , Victoria 3800, Australia.
  • Edmonds MT; School of Physics and Astronomy and Monash Centre for Atomically Thin Materials, Monash University , Victoria 3800, Australia.
  • Ramakrishnan N; Department of Physics and Centre for Advanced 2D Materials, National University of Singapore , 117551, Singapore.
  • Liu C; School of Physics and Astronomy and Monash Centre for Atomically Thin Materials, Monash University , Victoria 3800, Australia.
  • Weber B; School of Physics and Astronomy and Monash Centre for Atomically Thin Materials, Monash University , Victoria 3800, Australia.
  • Tadich A; Australian Synchrotron, Clayton, Victoria 3168, Australia.
  • O'Donnell KM; Curtin University , Perth, Western Australia 6102, Australia.
  • Adam S; Department of Physics and Centre for Advanced 2D Materials, National University of Singapore , 117551, Singapore.
  • Fuhrer MS; Yale-NUS College , 6 College Avenue East, 138614, Singapore.
Nano Lett ; 16(5): 3210-4, 2016 05 11.
Article em En | MEDLINE | ID: mdl-27104635

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2016 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2016 Tipo de documento: Article