Time- and spatial-resolved XAFS spectroscopy in a single shot: new analytical possibilities for in situ material characterization.
J Synchrotron Radiat
; 23(Pt 3): 769-76, 2016 05.
Article
em En
| MEDLINE
| ID: mdl-27140157
ABSTRACT
A new concept that comprises both time- and lateral-resolved X-ray absorption fine-structure information simultaneously in a single shot is presented. This uncomplicated set-up was tested at the BAMline at BESSY-II (Berlin, Germany). The primary broadband beam was generated by a double multilayer monochromator. The transmitted beam through the sample is diffracted by a convexly bent Si (111) crystal, producing a divergent beam. This, in turn, is collected by either an energy-sensitive area detector, the so-called color X-ray camera, or by an area-sensitive detector based on a CCD camera, in θ-2θ geometry. The first tests were performed with thin metal foils and some iron oxide mixtures. A time resolution of lower than 1â
s together with a spatial resolution in one dimension of at least 50â
µm is achieved.
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01-internacional
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MEDLINE
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En
Revista:
J Synchrotron Radiat
Ano de publicação:
2016
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Article