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The α-ß circular scanning with large range and low noise.
Liu, J; You, X; Wang, Y; Gu, K; Liu, C; Tan, J.
Afiliação
  • Liu J; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
  • You X; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
  • Wang Y; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
  • Gu K; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
  • Liu C; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
  • Tan J; Centre of Ultra-Precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin, China.
J Microsc ; 266(2): 107-114, 2017 05.
Article em En | MEDLINE | ID: mdl-28295322
A circular-route scanning method called α-ß circular scanning is proposed and realized using sinusoidal signals with a constant phase difference of π/2. Experiments show that the circular scanning range of α-ß circular scanning is 57% greater than the rectangular scanning range of raster scanning within an effective optical field of view. Moreover, the scanning speed is improved by 7.8% over raster scanning because the whole sine signal is utilized in α-ß circular scanning whereas the flyback area of the saw-tooth signal needs to be discarded in raster scanning. The maximum scanning acceleration decreases by a factor of 44, drastically decreasing the high noise, which should considerably elongate the lifetime of the galvanometers while inhibiting internal vibration. The proposed α-ß circular scanning technique could be used in scanning imaging, optical tweezers and laser-beam fabrication.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Microsc Ano de publicação: 2017 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Microsc Ano de publicação: 2017 Tipo de documento: Article