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Voltage-induced Interface Reconstruction and Electrical Instability of the Ferromagnet-Semiconductor Device.
Chang, Shu-Jui; Chang, Po-Chun; Lin, Wen-Chin; Lo, Shao-Hua; Chang, Liang-Chun; Lee, Shang-Fan; Tseng, Yuan-Chieh.
Afiliação
  • Chang SJ; Department of Materials Science & Engineering, National Chiao Tung University, Hsinchu, Taiwan.
  • Chang PC; Department of Physics, National Taiwan Normal University, Taipei, Taiwan.
  • Lin WC; Department of Physics, National Taiwan Normal University, Taipei, Taiwan.
  • Lo SH; Department of Materials Science & Engineering, National Chiao Tung University, Hsinchu, Taiwan.
  • Chang LC; Institute of Physics, Academia Sinica, Taipei, 30010, R.O.C., Taiwan.
  • Lee SF; Institute of Physics, Academia Sinica, Taipei, 30010, R.O.C., Taiwan.
  • Tseng YC; Department of Materials Science & Engineering, National Chiao Tung University, Hsinchu, Taiwan. yctseng21@mail.nctu.edu.tw.
Sci Rep ; 7(1): 339, 2017 03 23.
Article em En | MEDLINE | ID: mdl-28336961
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sci Rep Ano de publicação: 2017 Tipo de documento: Article