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Development of a secondary electron energy analyzer for a transmission electron microscope.
Magara, Hideyuki; Tomita, Takeshi; Kondo, Yukihito; Sato, Takafumi; Akase, Zentaro; Shindo, Daisuke.
Afiliação
  • Magara H; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
  • Tomita T; Electron Optics Division, JEOL Ltd., Akishima 196-8558, Japan.
  • Kondo Y; Electron Optics Division, JEOL Ltd., Akishima 196-8558, Japan.
  • Sato T; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
  • Akase Z; Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan.
  • Shindo D; Center for Emergent Matter Science (CEMS), RIKEN, Hirosawa 2-1, Wako, Saitama 351-0198, Japan.
Microscopy (Oxf) ; 67(2): 121-124, 2018 Apr 01.
Article em En | MEDLINE | ID: mdl-29370376
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microscopy (Oxf) Ano de publicação: 2018 Tipo de documento: Article