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A comparative study of defect formation in GaAs nanocrystals selectively grown on nanopatterned and flat Si(001) substrates.
Kozak, Roksolana; Prieto, Ivan; Arroyo Rojas Dasilva, Yadira; Erni, Rolf; von Känel, Hans; Bona, Gian-Luca; Rossell, Marta D.
Afiliação
  • Kozak R; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland. Electronic address: roksolana.kozak@empa.ch.
  • Prieto I; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland; Laboratory for Solid State Physics, ETH Zürich, Zürich, Switzerland.
  • Arroyo Rojas Dasilva Y; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland.
  • Erni R; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland.
  • von Känel H; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland; Laboratory for Solid State Physics, ETH Zürich, Zürich, Switzerland.
  • Bona GL; Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland.
  • Rossell MD; Electron Microscopy Center, Empa - Swiss Federal Laboratories for Materials Science & Technology, Dübendorf, Switzerland.
Micron ; 113: 83-90, 2018 10.
Article em En | MEDLINE | ID: mdl-30007860
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micron Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Micron Ano de publicação: 2018 Tipo de documento: Article