Insights into image contrast from dislocations in ADF-STEM.

Oveisi, E; Spadaro, M C; Rotunno, E; Grillo, V; Hébert, C

Oveisi, E; Spadaro, M C; Rotunno, E; Grillo, V; Hébert, C.

Afiliação

Oveisi E; Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne (CIME-EPFL), Lausanne, Switzerland; Electron Spectrometry and Microscopy Laboratory, École Polytechnique Fédérale de Lausanne (LSME-EPFL), Lausanne, Switzerland. Electronic address: emad.oveisi@epfl.ch.
Spadaro MC; Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne (CIME-EPFL), Lausanne, Switzerland.
Rotunno E; Institute of Nanoscience, National Research Council (NANO-CNR), Modena, Italy.
Grillo V; Institute of Nanoscience, National Research Council (NANO-CNR), Modena, Italy; Institute of Materials for Electronics and Magnetism, National Research Council (IMEM-CNR), Parma, Italy.
Hébert C; Interdisciplinary Centre for Electron Microscopy, École Polytechnique Fédérale de Lausanne (CIME-EPFL), Lausanne, Switzerland; Electron Spectrometry and Microscopy Laboratory, École Polytechnique Fédérale de Lausanne (LSME-EPFL), Lausanne, Switzerland. Electronic address: cecile.hebert@epfl.ch.

Ultramicroscopy ; 200: 139-148, 2019 05.

Article em En | MEDLINE | ID: mdl-30925259

Palavras-chave

ADF-STEM; Bloch-wave scattering theory; Dislocation contrast; Electron channelling; Grillo's strain-channelling equation

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Ultramicroscopy Ano de publicação: 2019 Tipo de documento: Article

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