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Electronic properties and structure of single crystal perylene.
Pookpanratana, S J; Goetz, K P; Bittle, E G; Haneef, H; You, L; Hacker, C A; Robey, S W; Jurchescu, O D; Ovsyannikov, R; Giangrisostomi, E.
Afiliação
  • Pookpanratana SJ; Engineering Physics Division, National Institute of Standards and Technology (NIST), USA.
  • Goetz KP; Department of Physics, Wake Forest University, USA.
  • Bittle EG; Physical Chemistry Institute, Universität Heidelberg, Germany.
  • Haneef H; Engineering Physics Division, National Institute of Standards and Technology (NIST), USA.
  • You L; Department of Physics, Wake Forest University, USA.
  • Hacker CA; Engineering Physics Division, National Institute of Standards and Technology (NIST), USA.
  • Robey SW; Theiss Research, USA.
  • Jurchescu OD; Engineering Physics Division, National Institute of Standards and Technology (NIST), USA.
  • Ovsyannikov R; Materials Measurement Science Division, NIST, USA.
  • Giangrisostomi E; Department of Physics, Wake Forest University, USA.
Org Electron ; 612018.
Article em En | MEDLINE | ID: mdl-30983924
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Org Electron Ano de publicação: 2018 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Org Electron Ano de publicação: 2018 Tipo de documento: Article