Quantitative Mapping of the Charge Density in a Monolayer of MoS<sub>2</sub> at Atomic Resolution by Off-Axis Electron Holography.

Boureau, Victor; Sklenard, Benoit; McLeod, Robert; Ovchinnikov, Dmitry; Dumcenco, Dumitru; Kis, Andras; Cooper, David

Quantitative Mapping of the Charge Density in a Monolayer of MoS₂ at Atomic Resolution by Off-Axis Electron Holography.

Boureau, Victor; Sklenard, Benoit; McLeod, Robert; Ovchinnikov, Dmitry; Dumcenco, Dumitru; Kis, Andras; Cooper, David.

Afiliação

Boureau V; Université Grenoble Alpes, CEA, LETI , F-38054 Grenoble , France.
Sklenard B; Université Grenoble Alpes, CEA, LETI , F-38054 Grenoble , France.
McLeod R; Université Grenoble Alpes, CEA, INAC , F-38054 Grenoble , France.
Ovchinnikov D; Electrical Engineering Institute , Ecole Polytechnique Federale de Lausanne , CH-1015 Lausanne , Switzerland.
Dumcenco D; Electrical Engineering Institute , Ecole Polytechnique Federale de Lausanne , CH-1015 Lausanne , Switzerland.
Kis A; Electrical Engineering Institute , Ecole Polytechnique Federale de Lausanne , CH-1015 Lausanne , Switzerland.
Cooper D; Université Grenoble Alpes, CEA, LETI , F-38054 Grenoble , France.

ACS Nano ; 14(1): 524-530, 2020 Jan 28.

Article em En | MEDLINE | ID: mdl-31820927

Palavras-chave

MoS2; charge density; electric field; electric potential; electron holography; high-resolution; sulfur vacancy

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Nano Ano de publicação: 2020 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Nano Ano de publicação: 2020 Tipo de documento: Article