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Gate voltage impact on charge mobility in end-on stacked conjugated oligomers.
Sun, Shih-Jye; Mensík, Miroslav; Toman, Petr; Chung, Cheng-Han; Ganzorig, Chimed; Pfleger, Jirí.
Afiliação
  • Sun SJ; Department of Applied Physics, National University of Kaohsiung, Kaohsiung 811, Taiwan, Republic of China and Department of Physics, National Sun Yat-sen University, Kaohsiung 80424, Taiwan, Republic of China.
  • Mensík M; Institute of Macromolecular Chemistry, AS CR, v.v.i., Heyrovského nám. 2, 162 06 Prague, Czech Republic. mensik@imc.cas.cz.
  • Toman P; Institute of Macromolecular Chemistry, AS CR, v.v.i., Heyrovského nám. 2, 162 06 Prague, Czech Republic. mensik@imc.cas.cz.
  • Chung CH; Department of Applied Physics, National University of Kaohsiung, Kaohsiung 811, Taiwan, Republic of China.
  • Ganzorig C; Nano and Chemical Engineering Department, New Mongol Institute of Technology, Ulaanbaatar 13372, Mongolia.
  • Pfleger J; Institute of Macromolecular Chemistry, AS CR, v.v.i., Heyrovského nám. 2, 162 06 Prague, Czech Republic. mensik@imc.cas.cz.
Phys Chem Chem Phys ; 22(15): 8096-8108, 2020 Apr 15.
Article em En | MEDLINE | ID: mdl-32242554
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Chem Chem Phys Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Phys Chem Chem Phys Ano de publicação: 2020 Tipo de documento: Article