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Localized Strain Measurement in Molecular Beam Epitaxially Grown Chalcogenide Thin Films by Micro-Raman Spectroscopy.
Li, Qiu; Wang, Yong; Li, Tiantian; Li, Wei; Wang, Feifan; Janotti, Anderson; Law, Stephanie; Gu, Tingyi.
Afiliação
  • Li Q; Tianjin Key Laboratory of High Speed Cutting and Precision Machining, Tianjin University of Technology and Education, Tianjin 300222, China.
  • Wang Y; Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States.
  • Li T; Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, United States.
  • Li W; Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States.
  • Wang F; Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, United States.
  • Janotti A; Department of Electrical and Computer Engineering, University of Delaware, Newark, Delaware 19716, United States.
  • Law S; State Key Laboratory for Mesoscopic Physics & Department of Physics Collaborative Innovation Center of Quantum Matter, Peking University, Beijing 100871, China.
  • Gu T; Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, United States.
ACS Omega ; 5(14): 8090-8096, 2020 Apr 14.
Article em En | MEDLINE | ID: mdl-32309718
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Omega Ano de publicação: 2020 Tipo de documento: Article
Texto completo
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PubMed Links
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Omega Ano de publicação: 2020 Tipo de documento: Article