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A high-speed atomic force microscopy with super resolution based on path planning scanning.
Wu, Yinan; Fang, Yongchun; Wang, Chao; Liu, Cunhuan; Fan, Zhi.
Afiliação
  • Wu Y; Institute of Robotics and Automatic Information System, Nankai University, Tianjin, 300350, China; Tianjin Key Laboratory of Intelligent Robotics, Tianjin, 300350, China.
  • Fang Y; Institute of Robotics and Automatic Information System, Nankai University, Tianjin, 300350, China; Tianjin Key Laboratory of Intelligent Robotics, Tianjin, 300350, China. Electronic address: fangyc@nankai.edu.cn.
  • Wang C; Institute of Robotics and Automatic Information System, Nankai University, Tianjin, 300350, China; Tianjin Key Laboratory of Intelligent Robotics, Tianjin, 300350, China.
  • Liu C; Institute of Robotics and Automatic Information System, Nankai University, Tianjin, 300350, China; Tianjin Key Laboratory of Intelligent Robotics, Tianjin, 300350, China.
  • Fan Z; Institute of Robotics and Automatic Information System, Nankai University, Tianjin, 300350, China; Tianjin Key Laboratory of Intelligent Robotics, Tianjin, 300350, China.
Ultramicroscopy ; 213: 112991, 2020 Jun.
Article em En | MEDLINE | ID: mdl-32334282
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2020 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2020 Tipo de documento: Article