Single-Particle Tracking with Scanning Non-Linear Microscopy.

Travers, Théo; Colin, Vincent G; Loumaigne, Matthieu; Barillé, Régis; Gindre, Denis

Travers, Théo; Colin, Vincent G; Loumaigne, Matthieu; Barillé, Régis; Gindre, Denis.

Afiliação

Travers T; MOLTECH-Anjou Laboratory, UMR CNRS 6200, University of Angers, 2 bd Lavoisier, 49045 Angers CEDEX, France.
Colin VG; MOLTECH-Anjou Laboratory, UMR CNRS 6200, University of Angers, 2 bd Lavoisier, 49045 Angers CEDEX, France.
Loumaigne M; MOLTECH-Anjou Laboratory, UMR CNRS 6200, University of Angers, 2 bd Lavoisier, 49045 Angers CEDEX, France.
Barillé R; MOLTECH-Anjou Laboratory, UMR CNRS 6200, University of Angers, 2 bd Lavoisier, 49045 Angers CEDEX, France.
Gindre D; MOLTECH-Anjou Laboratory, UMR CNRS 6200, University of Angers, 2 bd Lavoisier, 49045 Angers CEDEX, France.

Nanomaterials (Basel) ; 10(8)2020 Aug 03.

Article em En | MEDLINE | ID: mdl-32756453

Palavras-chave

free diffusion; non-linear microscopy; particle size characterization; particle tracking algorithms; scanning microscopy; single particle tracking; two-photon fluorescence imaging

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2020 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2020 Tipo de documento: Article