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Raman Scattering Study on the Influence of E-Beam Bombardment on Si Electron Lens.
Lee, Geon-Woo; Lee, Young-Bok; Baek, Dong-Hyun; Kim, Jung-Gon; Kim, Ho-Seob.
Afiliação
  • Lee GW; Department of Physics and Nano-Science, Sunmoon University, Asan-si 31460, Korea.
  • Lee YB; Center for Next-Generation Semiconductor Technology, Sunmoon University, Asan-si 31460, Korea.
  • Baek DH; Department of Physics and Nano-Science, Sunmoon University, Asan-si 31460, Korea.
  • Kim JG; Center for Next-Generation Semiconductor Technology, Sunmoon University, Asan-si 31460, Korea.
  • Kim HS; Center for Next-Generation Semiconductor Technology, Sunmoon University, Asan-si 31460, Korea.
Molecules ; 26(9)2021 May 08.
Article em En | MEDLINE | ID: mdl-34066676
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Molecules Ano de publicação: 2021 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Molecules Ano de publicação: 2021 Tipo de documento: Article