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Correlation symmetry analysis of electron nanodiffraction from amorphous materials.
Huang, Shuoyuan; Francis, Carter; Ketkaew, Jittisa; Schroers, Jan; Voyles, Paul M.
Afiliação
  • Huang S; Department of Materials Science and Engineering, University of Wisconsin Madison, Madison, WI 53706, USA.
  • Francis C; Department of Materials Science and Engineering, University of Wisconsin Madison, Madison, WI 53706, USA.
  • Ketkaew J; Mechanical Engineering, Yale University, New Haven, Connecticut, 06511, USA.
  • Schroers J; Mechanical Engineering, Yale University, New Haven, Connecticut, 06511, USA.
  • Voyles PM; Department of Materials Science and Engineering, University of Wisconsin Madison, Madison, WI 53706, USA. Electronic address: paul.voyles@wisc.edu.
Ultramicroscopy ; 232: 113405, 2022 Jan.
Article em En | MEDLINE | ID: mdl-34673441
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article
Texto completo
Imprimir
XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Ultramicroscopy Ano de publicação: 2022 Tipo de documento: Article