Self-Attentive Adversarial Stain Normalization.

Shrivastava, Aman; Adorno, William; Sharma, Yash; Ehsan, Lubaina; Ali, S Asad; Moore, Sean R; Amadi, Beatrice; Kelly, Paul; Syed, Sana; Brown, Donald E

Shrivastava, Aman; Adorno, William; Sharma, Yash; Ehsan, Lubaina; Ali, S Asad; Moore, Sean R; Amadi, Beatrice; Kelly, Paul; Syed, Sana; Brown, Donald E.

Afiliação

Shrivastava A; University of Virginia, Charlottesville, Virginia, USA.
Adorno W; University of Virginia, Charlottesville, Virginia, USA.
Sharma Y; University of Virginia, Charlottesville, Virginia, USA.
Ehsan L; University of Virginia, Charlottesville, Virginia, USA.
Ali SA; Aga Khan University, Karachi, Pakistan.
Moore SR; University of Virginia, Charlottesville, Virginia, USA.
Amadi B; University of Zambia School of Medicine, Lusaka, Zambia.
Kelly P; University of Zambia School of Medicine, Lusaka, Zambia.
Syed S; Queen Mary University of London, London, England.
Brown DE; University of Virginia, Charlottesville, Virginia, USA.

Pattern Recognit (2021) ; 12661: 120-140, 2021 Jan.

Article em En | MEDLINE | ID: mdl-34693406

Palavras-chave

Adversarial Learning; Stain Normalization

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: Pattern Recognit (2021) Ano de publicação: 2021 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google