A Fault Diagnosis Method of Modular Analog Circuit Based on SVDD and D-S Evidence Theory.

Sun, Peng; Yang, Zhiming; Jiang, Yueming; Jia, Shaohua; Peng, Xiyuan

Sun, Peng; Yang, Zhiming; Jiang, Yueming; Jia, Shaohua; Peng, Xiyuan.

Afiliação

Sun P; School of Electronics and Information Engineering, Harbin Institute of Technology, 150100 Harbin, China.
Yang Z; School of Electronics and Information Engineering, Harbin Institute of Technology, 150100 Harbin, China.
Jiang Y; School of Electronics and Information Engineering, Harbin Institute of Technology, 150100 Harbin, China.
Jia S; School of Electronics and Information Engineering, Harbin Institute of Technology, 150100 Harbin, China.
Peng X; School of Electronics and Information Engineering, Harbin Institute of Technology, 150100 Harbin, China.

Sensors (Basel) ; 21(20)2021 Oct 18.

Article em En | MEDLINE | ID: mdl-34696102

Assuntos

Análise de Componente Principal; Simulação por Computador

Palavras-chave

DS evidence theory; SVDD; fault diagnosis model; state detection

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Análise de Componente Principal Tipo de estudo: Diagnostic_studies Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article

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