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Promotion in solid phase reaction of Pt/SiO x bilayer film by electron-orbital-selective-excitation.
Yasuda, H; Sato, K; Ichikawa, S; Imamura, M; Takahashi, K; Mori, H.
Afiliação
  • Yasuda H; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University Ibaraki Osaka 567-0047 Japan yasuda@uhvem.osaka-u.ac.jp.
  • Sato K; Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University Suita Osaka 565-0871 Japan.
  • Ichikawa S; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University Ibaraki Osaka 567-0047 Japan yasuda@uhvem.osaka-u.ac.jp.
  • Imamura M; Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University Suita Osaka 565-0871 Japan.
  • Takahashi K; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University Ibaraki Osaka 567-0047 Japan yasuda@uhvem.osaka-u.ac.jp.
  • Mori H; Division of Materials and Manufacturing Science, Graduate School of Engineering, Osaka University Suita Osaka 565-0871 Japan.
RSC Adv ; 11(2): 894-898, 2020 Dec 24.
Article em En | MEDLINE | ID: mdl-35423712
ABSTRACT
A thermally impossible positive free energy reaction can proceed by electron-orbital-selective excitation. When the Si 2p core level is photo-excited in Pt/SiO x bilayer films, Coulomb repulsion at the final two-hole state localized in the valence band by an interatomic Auger transition induces dissociation of the O atom and formation of a Si-Pt bond. Consequently, Pt2Si silicide is formed by a positive free energy reaction. Under a single particle excitation of the valence band, low probability of the coexistence of the two-hole state for picosecond order suppresses to allow the reaction to proceed.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: RSC Adv Ano de publicação: 2020 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: RSC Adv Ano de publicação: 2020 Tipo de documento: Article