New directions in the analysis of buried interfaces for device technology by hard X-ray photoemission.

Renault, O; Deleuze, P-M; Courtin, J; Bure, T R; Gauthier, N; Nolot, E; Robert-Goumet, C; Pauly, N; Martinez, E; Artyushkova, K

Renault, O; Deleuze, P-M; Courtin, J; Bure, T R; Gauthier, N; Nolot, E; Robert-Goumet, C; Pauly, N; Martinez, E; Artyushkova, K.

Afiliação

Renault O; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Deleuze PM; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Courtin J; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Bure TR; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Gauthier N; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Nolot E; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Robert-Goumet C; Université Clermont Auvergne, Clermont Auvergne INP, CNRS, Institut Pascal, F-63000 Clermont-Ferrand, France.
Pauly N; Université Libre de Bruxelles, Service de Métrologie Nucléaire (CP 165/84), 50 av. F. D. Roosevelt, B-1050 Brussels, Belgium.
Martinez E; Univ. Grenoble-Alpes, CEA, Leti, 38000 Grenoble, France. olivier.renault@cea.fr.
Artyushkova K; Physical Electronics Inc., 18725 Lake Drive E, Chanhassen, MN 55317, USA.

Faraday Discuss ; 236(0): 288-310, 2022 08 25.

Article em En | MEDLINE | ID: mdl-35543197

Assuntos

Tecnologia; Espectroscopia Fotoeletrônica; Raios X

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Assunto principal: Tecnologia Idioma: En Revista: Faraday Discuss Ano de publicação: 2022 Tipo de documento: Article

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