A Robust Neural Network for Extracting Dynamics from Electrostatic Force Microscopy Data.
J Chem Inf Model
; 62(18): 4342-4350, 2022 09 26.
Article
em En
| MEDLINE
| ID: mdl-36099208
ABSTRACT
Advances in scanning probe microscopy (SPM) methods such as time-resolved electrostatic force microscopy (trEFM) now permit the mapping of fast local dynamic processes with high resolution in both space and time, but such methods can be time-consuming to analyze and calibrate. Here, we design and train a regression neural network (NN) that accelerates and simplifies the extraction of local dynamics from SPM data directly in a cantilever-independent manner, allowing the network to process data taken with different cantilevers. We validate the NN's ability to recover local dynamics with a fidelity equal to or surpassing conventional, more time-consuming, calibrations using both simulated and real microscopy data. We apply this method to extract accurate photoinduced carrier dynamics on n = 1 butylammonium lead iodide, a halide perovskite semiconductor film that is of interest for applications in both solar photovoltaics and quantum light sources. Finally, we use SHapley Additive exPlanations to evaluate the robustness of the trained model, confirm its cantilever-independence, and explore which parts of the trEFM signal are important to the network.
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1
Coleções:
01-internacional
Base de dados:
MEDLINE
Assunto principal:
Redes Neurais de Computação
/
Iodetos
Idioma:
En
Revista:
J Chem Inf Model
Ano de publicação:
2022
Tipo de documento:
Article