Laser-Induced Crystallization of Copper Oxide Thin Films: A Comparison between Gaussian and Chevron Beam Profiles.

Bodeau, William; Otoge, Kaisei; Yeh, Wenchang; Kobayashi, Nobuhiko P

Bodeau, William; Otoge, Kaisei; Yeh, Wenchang; Kobayashi, Nobuhiko P.

Afiliação

Bodeau W; Electrical and Computer Engineering Department, Baskin School of Engineering, University of California Santa Cruz, Santa Cruz, California 95064, United States.
Otoge K; Graduate School of Natural Science and Technology, Shimane University, Matsue, Shimane 690-8504, Japan.
Yeh W; Graduate School of Natural Science and Technology, Shimane University, Matsue, Shimane 690-8504, Japan.
Kobayashi NP; Electrical and Computer Engineering Department, Baskin School of Engineering, University of California Santa Cruz, Santa Cruz, California 95064, United States.

ACS Appl Mater Interfaces ; 2022 Oct 27.

Article em En | MEDLINE | ID: mdl-36301072

Palavras-chave

Gaussian; beam profile; cellular automaton; chevron; copper oxide; crystallization; laser

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Prognostic_studies Idioma: En Revista: ACS Appl Mater Interfaces Ano de publicação: 2022 Tipo de documento: Article

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