Polarization-sensitive intensity diffraction tomography.

Song, Seungri; Kim, Jeongsoo; Moon, Taegyun; Seong, Baekcheon; Kim, Woovin; Yoo, Chang-Hyuk; Choi, Jun-Kyu; Joo, Chulmin

Song, Seungri; Kim, Jeongsoo; Moon, Taegyun; Seong, Baekcheon; Kim, Woovin; Yoo, Chang-Hyuk; Choi, Jun-Kyu; Joo, Chulmin.

Afiliação

Song S; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
Kim J; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
Moon T; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
Seong B; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
Kim W; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea.
Yoo CH; Small Machines Company, Ltd., Seoul, 04808, Republic of Korea.
Choi JK; Small Machines Company, Ltd., Seoul, 04808, Republic of Korea.
Joo C; Department of Mechanical Engineering, Yonsei University, Seoul, 03722, Republic of Korea. cjoo@yonsei.ac.kr.

Light Sci Appl ; 12(1): 124, 2023 May 18.

Article em En | MEDLINE | ID: mdl-37202421

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Diagnostic_studies Idioma: En Revista: Light Sci Appl Ano de publicação: 2023 Tipo de documento: Article

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