Increasing the Accuracy of the Characterization of a Thin Semiconductor or Dielectric Film on a Substrate from Only One Quasi-Normal Incidence UV/Vis/NIR Reflectance Spectrum of the Sample.

Minkov, Dorian; Angelov, George; Marquez, Emilio; Radonov, Rossen; Rusev, Rostislav; Nikolov, Dimitar; Ruano, Susana

Minkov, Dorian; Angelov, George; Marquez, Emilio; Radonov, Rossen; Rusev, Rostislav; Nikolov, Dimitar; Ruano, Susana.

Afiliação

Minkov D; Scientific Research Section (NIS), Technical University, 1000 Sofia, Bulgaria.
Angelov G; Department of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.
Marquez E; Faculty of Science, Department of Condensed-Matter Physics, University of Cadiz, Puerto Real, 11510 Cadiz, Spain.
Radonov R; Department of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.
Rusev R; Department of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.
Nikolov D; Department of Microelectronics, Faculty of Electronics Engineering and Technologies, Technical University, 1000 Sofia, Bulgaria.
Ruano S; Photovoltaic Solar Energy Unit, Centre for Energy, Environmental and Technological Research (CIEMAT), Avenida Complutense 40, 28040 Madrid, Spain.

Nanomaterials (Basel) ; 13(17)2023 Aug 24.

Article em En | MEDLINE | ID: mdl-37686915

Palavras-chave

accurate characterization; dispersion model; optimized envelope method; reflectance spectrum; semiconductor or insulator; spectrophotometry; thin film

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Tipo de estudo: Incidence_studies / Prognostic_studies / Risk_factors_studies Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2023 Tipo de documento: Article

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