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Super-resolution Reflection Microscopy via Absorbance Modulation.
Jain, Parul; Geisler, Claudia; Leitz, Dennis; Udachin, Viktor; Nagorny, Sven; Weingartz, Thea; Adams, Jörg; Schmidt, Andreas; Rembe, Christian; Egner, Alexander.
Afiliação
  • Jain P; Department of Optical Nanoscopy, Institute for Nanophotonics Göttingen e.V., 37077 Göttingen, Germany.
  • Geisler C; Department of Optical Nanoscopy, Institute for Nanophotonics Göttingen e.V., 37077 Göttingen, Germany.
  • Leitz D; Institute of Electrical Information Technology, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Udachin V; Clausthal Center of Materials Technology, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Nagorny S; Institute of Organic Chemistry, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Weingartz T; Institute of Organic Chemistry, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Adams J; Institute of Physical Chemistry, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Schmidt A; Institute of Organic Chemistry, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Rembe C; Institute of Electrical Information Technology, Clausthal University of Technology, 38678 Clausthal-Zellerfeld, Germany.
  • Egner A; Department of Optical Nanoscopy, Institute for Nanophotonics Göttingen e.V., 37077 Göttingen, Germany.
ACS Nanosci Au ; 3(5): 375-380, 2023 Oct 18.
Article em En | MEDLINE | ID: mdl-37868228
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Nanosci Au Ano de publicação: 2023 Tipo de documento: Article
Texto completo
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XML
PubMed Links
Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: ACS Nanosci Au Ano de publicação: 2023 Tipo de documento: Article