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Perspectives of Ferroelectric Wurtzite AlScN: Material Characteristics, Preparation, and Applications in Advanced Memory Devices.
Qin, Haiming; He, Nan; Han, Cong; Zhang, Miaocheng; Wang, Yu; Hu, Rui; Wu, Jiawen; Shao, Weijing; Saadi, Mohamed; Zhang, Hao; Hu, Youde; Liu, Yi; Wang, Xinpeng; Tong, Yi.
Afiliação
  • Qin H; College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China.
  • He N; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Han C; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Zhang M; College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, 9 Wenyuan Road, Nanjing 210023, China.
  • Wang Y; College of Integrated Circuit Science and Engineering, Nanjing University of Posts and Telecommunications, Nanjing 210023, China.
  • Hu R; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Wu J; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Shao W; College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, 9 Wenyuan Road, Nanjing 210023, China.
  • Saadi M; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Zhang H; College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, 9 Wenyuan Road, Nanjing 210023, China.
  • Hu Y; State Key Laboratory of Millimeter Waves, Southeast University, Nanjing 210096, China.
  • Liu Y; Institute of Functional Nano & Soft Materials, Soochow University, Suzhou 215123, China.
  • Wang X; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
  • Tong Y; Gusu Laboratory of Materials, 388 Ruoshui Road, Suzhou 215123, China.
Nanomaterials (Basel) ; 14(11)2024 Jun 06.
Article em En | MEDLINE | ID: mdl-38869611
ABSTRACT
Ferroelectric, phase-change, and magnetic materials are considered promising candidates for advanced memory devices. Under the development dilemma of traditional silicon-based memory devices, ferroelectric materials stand out due to their unique polarization properties and diverse manufacturing techniques. On the occasion of the 100th anniversary of the birth of ferroelectricity, scandium-doped aluminum nitride, which is a different wurtzite structure, was reported to be ferroelectric with a larger coercive, remanent polarization, curie temperature, and a more stable ferroelectric phase. The inherent advantages have attracted widespread attention, promising better performance when used as data storage materials and better meeting the needs of the development of the information age. In this paper, we start from the characteristics and development history of ferroelectric materials, mainly focusing on the characteristics, preparation, and applications in memory devices of ferroelectric wurtzite AlScN. It compares and analyzes the unique advantages of AlScN-based memory devices, aiming to lay a theoretical foundation for the development of advanced memory devices in the future.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Ano de publicação: 2024 Tipo de documento: Article