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The origins of dual-peak emission and anomalous exciton decay in 2D Sn-based perovskites.
Wang, Xinrui; Wei, Yingqiang; Kuang, Zhiyuan; Wang, Xing; Dai, Mian; Li, Xiuyong; Lu, Runqing; Liu, Wang; Chang, Jin; Ma, Chao; Huang, Wei; Peng, Qiming; Wang, Jianpu.
Afiliação
  • Wang X; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Wei Y; The 58th Research Institute of China Electronics Technology Group 217Corporation, Wuxi, China.
  • Kuang Z; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Wang X; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Dai M; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Li X; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Lu R; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Liu W; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Chang J; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Ma C; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Huang W; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
  • Peng Q; Strait Laboratory of Flexible Electronics (SLoFE), Fuzhou, China.
  • Wang J; Key Laboratory of Flexible Electronics (KLOFE), Institute of Advanced Materials (IAM) and School of Flexible Electronics (Future Technologies), Nanjing Tech University (NanjingTech), Nanjing, China.
J Chem Phys ; 161(1)2024 Jul 07.
Article em En | MEDLINE | ID: mdl-38953446
ABSTRACT
Two-dimensional (2D) Sn-based perovskites exhibit significant potential in diverse optoelectronic applications, such as on-chip lasers and photodetectors. Yet, the underlying mechanism behind the frequently observed dual-peak emission in 2D Sn-based perovskites remains a subject of intense debate, and there is a lack of research on the carrier dynamics in these materials. In this study, we investigate these issues in a representative 2D Sn-based perovskite, namely, PEA2SnI4, through temperature-, excitation intensity-, angle-, and time-dependent photoluminescence studies. The results indicate that the high- and low-energy peaks originate from in-face and out-of-face dipole transitions, respectively. In addition, we observe an anomalous increase in the non-radiative recombination rate as temperature decreases. After ruling out enhanced electron-phonon coupling and Auger recombination as potential causes of the anomalous carrier dynamics, we propose that the significantly increased exciton binding energy (Eb) plays a decisive role. The increased Eb arises from enhanced electronic localization, a consequence of weakened lattice distortion at low temperatures, as confirmed by first-principles calculations and temperature-dependent x-ray diffraction measurements. These findings offer valuable insights into the electronic processes in the unique 2D Sn-based perovskites.

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Chem Phys Ano de publicação: 2024 Tipo de documento: Article

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Chem Phys Ano de publicação: 2024 Tipo de documento: Article